1. Probe Stations

Probe Station is used to physically acquire signals from the internal nodes of a semiconductor device. The probe station utilizes manipulators which allow the precise positioning of thin needles on the surface of a semiconductor device. If the device is being electrically stimulated, the signal is acquired by the probe and is displayed on an oscilloscope or SMU.

HPVT offers different types of Probe Stations

1. High and Low Temperature probe station 2. Hall Effect Probe Station

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2. Gas Sensing Systems

Gas Sensing Systems designed for measuring I-V (current voltage) Characterization of gas sensors and other gas sensitive devices, such as Resistive Plate Chambers (RPCs). Its primary function is to ensure a homogeneous and stable mixture of gases at a precisely controlled concentration, pressure and temperature before the mixture reaches the sensor or device under test.

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